TUTCRIS - Tampereen teknillinen yliopisto


Multi-scheme chemical ionization inlet (MION) for fast switching of reagent ion chemistry in atmospheric pressure chemical ionization mass spectrometry (CIMS) applications



JulkaisuAtmospheric Measurement Techniques
DOI - pysyväislinkit
TilaJulkaistu - 17 joulukuuta 2019
OKM-julkaisutyyppiA1 Alkuperäisartikkeli


A novel chemical ionization inlet named the Multi-scheme chemical IONization inlet (MION), Karsa Ltd., Helsinki, Finland) capable of fast switching between multiple reagent ion schemes is presented, and its performance is demonstrated by measuring several known oxidation products from much-studied cyclohexene and α-pinene ozonolysis systems by applying consecutive bromide (Br-) and nitrate (NO3- ) chemical ionization. Experiments were performed in flow tube reactors under atmospheric pressure and room temperature (22 °C) utilizing an atmospheric pressure interface time-of-flight mass spectrometer (APi-ToFMS, Tofwerk Ltd., Thun, Switzerland) as the detector. The application of complementary ion modes in probing the same steady-state reaction mixture enabled a far more complete picture of the detailed autoxidation process; the HO2 radical and the least-oxidized reaction products were retrieved with Br- ionization, whereas the highest-oxidized reaction products were detected in the NO3- mode, directly providing information on the first steps and on the ultimate endpoint of oxidation, respectively. While chemical ionization inlets with multiple reagent ion capabilities have been reported previously, an application in which the charging of the sample occurs at atmospheric pressure with practically no sample pretreatment, and with the potential to switch the reagent ion scheme within a second timescale, has not been introduced previously. Also, the ability of bromide ionization to detect highly oxygenated organic molecules (HOM) from atmospheric autoxidation reactions has not been demonstrated prior to this investigation.

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