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TUTCRIS

Nanoannotator – Novel Image Analysis Method for Nanoparticle Size Analysis

Tutkimustuotos: Konferenssiesitys, posteri tai abstrakti

Yksityiskohdat

AlkuperäiskieliEnglanti
TilaJulkaistu - kesäkuuta 2016
Tapahtuma67th Annual Conference of the Nordic Microscopy Society - Norwegian University of Science and Technology, Trondheim, Norja
Kesto: 7 kesäkuuta 201610 kesäkuuta 2016
https://www.ntnu.edu/physics/scandem2016

Conference

Conference67th Annual Conference of the Nordic Microscopy Society
MaaNorja
KaupunkiTrondheim
Ajanjakso7/06/1610/06/16
www-osoite

Tiivistelmä

Nanoparticles have unique properties which directly correlate to their size, shape and size distribution. Thus the full utilization of their properties requires comprehensive characterization of the aforementioned features. TEM analysis provides a lot of essential information of nanoparticles’ properties such as primary particle size, morphology of particles and agglomerates as well as composition and phase structure. However, the size distribution measurement from TEM images is typically demanding, e.g., due to the tendency of nanoparticles to agglomerate and the poor efficiency of traditional image analyzing methods. In this study we present a novel image analysis technique to measure the nanoparticle size distribution from TEM images and compare it to other traditional methods.

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