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On the determination of χ(2) in thin films: a comparison of one-beam second-harmonic generation measurement methodologies

Tutkimustuotosvertaisarvioitu

Standard

On the determination of χ(2) in thin films: a comparison of one-beam second-harmonic generation measurement methodologies. / Hermans, Artur; Kieninger, Clemens; Koskinen, Kalle; Wickberg, Andreas; Solano, Eduardo; Dendooven, Jolien; Kauranen, Martti; Clemmen, Stéphane; Wegener, Martin; Koos, Christian; Baets, Roel.

julkaisussa: Scientific Reports, Vuosikerta 7, 44581, 20.03.2017.

Tutkimustuotosvertaisarvioitu

Harvard

Hermans, A, Kieninger, C, Koskinen, K, Wickberg, A, Solano, E, Dendooven, J, Kauranen, M, Clemmen, S, Wegener, M, Koos, C & Baets, R 2017, 'On the determination of χ(2) in thin films: a comparison of one-beam second-harmonic generation measurement methodologies', Scientific Reports, Vuosikerta. 7, 44581. https://doi.org/10.1038/srep44581

APA

Hermans, A., Kieninger, C., Koskinen, K., Wickberg, A., Solano, E., Dendooven, J., ... Baets, R. (2017). On the determination of χ(2) in thin films: a comparison of one-beam second-harmonic generation measurement methodologies. Scientific Reports, 7, [44581]. https://doi.org/10.1038/srep44581

Vancouver

Hermans A, Kieninger C, Koskinen K, Wickberg A, Solano E, Dendooven J et al. On the determination of χ(2) in thin films: a comparison of one-beam second-harmonic generation measurement methodologies. Scientific Reports. 2017 maalis 20;7. 44581. https://doi.org/10.1038/srep44581

Author

Hermans, Artur ; Kieninger, Clemens ; Koskinen, Kalle ; Wickberg, Andreas ; Solano, Eduardo ; Dendooven, Jolien ; Kauranen, Martti ; Clemmen, Stéphane ; Wegener, Martin ; Koos, Christian ; Baets, Roel. / On the determination of χ(2) in thin films: a comparison of one-beam second-harmonic generation measurement methodologies. Julkaisussa: Scientific Reports. 2017 ; Vuosikerta 7.

Bibtex - Lataa

@article{9ab5eebe1a654bcb96b295590be2e208,
title = "On the determination of χ(2) in thin films: a comparison of one-beam second-harmonic generation measurement methodologies",
abstract = "The determination of the second-order susceptibility (χ(2)) of thin film samples can be a delicate matter since well-established χ(2) measurement methodologies such as the Maker fringe technique are best suited for nonlinear materials with large thicknesses typically ranging from tens of microns to several millimeters. Here we compare two different second-harmonic generation setups and the corresponding measurement methodologies that are especially advantageous for thin film χ(2) characterization. This exercise allows for cross-checking the χ(2) obtained for identical samples and identifying the main sources of error for the respective techniques. The development of photonic integrated circuits makes nonlinear thin films of particular interest, since they can be processed into long waveguides to create efficient nonlinear devices. The investigated samples are ABC-type nanolaminates, which were reported recently by two different research groups. However, the subsequent analysis can be useful for all researchers active in the field of thin film χ(2) characterization.",
author = "Artur Hermans and Clemens Kieninger and Kalle Koskinen and Andreas Wickberg and Eduardo Solano and Jolien Dendooven and Martti Kauranen and St{\'e}phane Clemmen and Martin Wegener and Christian Koos and Roel Baets",
year = "2017",
month = "3",
day = "20",
doi = "10.1038/srep44581",
language = "English",
volume = "7",
journal = "Scientific Reports",
issn = "2045-2322",
publisher = "Nature Publishing Group",

}

RIS (suitable for import to EndNote) - Lataa

TY - JOUR

T1 - On the determination of χ(2) in thin films: a comparison of one-beam second-harmonic generation measurement methodologies

AU - Hermans, Artur

AU - Kieninger, Clemens

AU - Koskinen, Kalle

AU - Wickberg, Andreas

AU - Solano, Eduardo

AU - Dendooven, Jolien

AU - Kauranen, Martti

AU - Clemmen, Stéphane

AU - Wegener, Martin

AU - Koos, Christian

AU - Baets, Roel

PY - 2017/3/20

Y1 - 2017/3/20

N2 - The determination of the second-order susceptibility (χ(2)) of thin film samples can be a delicate matter since well-established χ(2) measurement methodologies such as the Maker fringe technique are best suited for nonlinear materials with large thicknesses typically ranging from tens of microns to several millimeters. Here we compare two different second-harmonic generation setups and the corresponding measurement methodologies that are especially advantageous for thin film χ(2) characterization. This exercise allows for cross-checking the χ(2) obtained for identical samples and identifying the main sources of error for the respective techniques. The development of photonic integrated circuits makes nonlinear thin films of particular interest, since they can be processed into long waveguides to create efficient nonlinear devices. The investigated samples are ABC-type nanolaminates, which were reported recently by two different research groups. However, the subsequent analysis can be useful for all researchers active in the field of thin film χ(2) characterization.

AB - The determination of the second-order susceptibility (χ(2)) of thin film samples can be a delicate matter since well-established χ(2) measurement methodologies such as the Maker fringe technique are best suited for nonlinear materials with large thicknesses typically ranging from tens of microns to several millimeters. Here we compare two different second-harmonic generation setups and the corresponding measurement methodologies that are especially advantageous for thin film χ(2) characterization. This exercise allows for cross-checking the χ(2) obtained for identical samples and identifying the main sources of error for the respective techniques. The development of photonic integrated circuits makes nonlinear thin films of particular interest, since they can be processed into long waveguides to create efficient nonlinear devices. The investigated samples are ABC-type nanolaminates, which were reported recently by two different research groups. However, the subsequent analysis can be useful for all researchers active in the field of thin film χ(2) characterization.

U2 - 10.1038/srep44581

DO - 10.1038/srep44581

M3 - Article

VL - 7

JO - Scientific Reports

JF - Scientific Reports

SN - 2045-2322

M1 - 44581

ER -