TUTCRIS - Tampereen teknillinen yliopisto

TUTCRIS

Planar affine rectification from change of scale

Tutkimustuotosvertaisarvioitu

Yksityiskohdat

AlkuperäiskieliEnglanti
OtsikkoComputer Vision, ACCV 2010 - 10th Asian Conference on Computer Vision, Revised Selected Papers
Sivut347-360
Sivumäärä14
Vuosikerta6495 LNCS
PainosPART 4
DOI - pysyväislinkit
TilaJulkaistu - 2011
OKM-julkaisutyyppiA4 Artikkeli konferenssijulkaisussa
Tapahtuma10th Asian Conference on Computer Vision, ACCV 2010 - Queenstown, Uusi-Seelanti
Kesto: 8 marraskuuta 201012 marraskuuta 2010

Julkaisusarja

NimiLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
NumeroPART 4
Vuosikerta6495 LNCS
ISSN (painettu)03029743
ISSN (elektroninen)16113349

Conference

Conference10th Asian Conference on Computer Vision, ACCV 2010
MaaUusi-Seelanti
KaupunkiQueenstown
Ajanjakso8/11/1012/11/10

Tiivistelmä

A method for affine rectification of a plane exploiting knowledge of relative scale changes is presented. The rectifying transformation is fully specified by the relative scale change at three non-collinear points or by two pairs of points where the relative scale change is known; the relative scale change between the pairs is not required. The method also allows homography estimation between two views of a planar scene from three point-with-scale correspondences. The proposed method is simple to implement and without parameters; linear and thus supporting (algebraic) least squares solutions; and general, without restrictions on either the shape of the corresponding features or their mutual position. The wide applicability of the method is demonstrated on text rectification, detection of repetitive patterns, texture normalization and estimation of homography from three point-with-scale correspondences.