Product level accelerated reliability testing of motor drives with input power interruptions
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|Julkaisu||IEEE Transactions on Power Electronics|
|DOI - pysyväislinkit|
|Tila||Julkaistu - 1 toukokuuta 2015|
Motor drives utilizing power semiconductors play an important role in modern day electric motor control. Although the reliability of power semiconductors is widely studied, the product level reliability of motor drives has been studied markedly less even though their more complex control and measuring electronics often make them more vulnerable to environmental stresses. In order to advance product level accelerated reliability testing, customized test methods with multiple simultaneous or sequential stresses can be used. However, the knowledge of combined effects of different stresses is still largely unknown. In this research the reliability of a commercial motor drive was studied. Environmental conditions used included an 85 °C constant temperature test and an 85 °C test with 85% relative humidity. Additionally, input power interruptions were included to study the effect of sudden shortages of electricity. The results of the study showed that the mean time to failure for the devices tested with the input power interruptions was notably shorter than that for the test series without them. An especially clear effect of the input power interruptions was seen on the power MOSFETs of the motor drives. Moreover, the humidity was found to play an important role in the reliability of the motor drives.