Chingovska, I., Yang, J., Lei, Z., Yi, D., Li, S. Z., Kähm, O., Glaser, C., Darner, N., Kuijper, A., Nouak, A., Komulainen, J., Pereira, T., Gupta, S., Khandelwal, S., Bansal, S., Rai, A., Krishna, T., Goyal, D., Waris, M-A., Zhang, H., Ahmad, I., Kiranyaz, S.,
Gabbouj, M., Tronci, R., Pili, M., Sirena, N., Roli, F., Galbally, J., Fierrez, J., Pinto, A., Pedrini, H., Schwartz, W. S., Rocha, A., Anjos, A. & Marcel, S.,
2013,
6th IAPR International Conference on Biometrics (ICB-2013), 4-7 June 2013, Madrid, Spain. International Association of Pattern Recognition IAPR; Institute of Electrical and Electronics Engineers IEEE,
s. 1-6 6 Sivumäärä (International Conference on Biometrics).
Tutkimustuotos › › vertaisarvioitu