TUTCRIS - Tampereen teknillinen yliopisto

TUTCRIS

Statistical analysis of interference for nanoscale electromechanical wireless communication at VHF-band

Tutkimustuotosvertaisarvioitu

Yksityiskohdat

AlkuperäiskieliEnglanti
Sivut2040-2050
Sivumäärä11
JulkaisuIEEE Transactions on Signal Processing
Vuosikerta64
Numero8
DOI - pysyväislinkit
TilaJulkaistu - 15 huhtikuuta 2016
OKM-julkaisutyyppiA1 Alkuperäisartikkeli

Tiivistelmä

Nanoscale electromechanical wireless communication with on-off keying in the very high frequency (VHF) band (30-300 MHz) is studied for a receiver using a carbon nanotube (CNT). Previous studies on this topic have only considered continuous wave (CW) on-off keying which suffers from spectral widening due to sharp changes in the signal. Effects of the inter-symbol interference (ISI), the co-channel interference, and the adjacent channel interference on the received signal statistics have not been analyzed. The rise- and fall-times associated with the filtering of the incoming signal by the mechanical frequency response of the receiver's CNT have also been ignored. In this paper, Fourier-series based modeling and statistical analysis of decision variables are performed. The results and modeling in this study enable performance evaluation of CNT based receivers with an arbitrary number of interfering signals with arbitrary pulse shapes, and fully incorporates the transient signal components. Received signal statistics under interference are derived using the developed model. Numerical results are presented for Hanning pulse and trapezoidal pulse (which includes rectangular pulses corresponding to CW as a special case). The required guard intervals between pulses to mitigate ISI, required frequency separation between channels, and required spatial separation of co-channel networks (frequency reuse distance) are shown. These results show that large frequency reuse distance is required, limiting efficient spectrum utilization. However, the ISI and adjacent channel interference can be controlled more easily with a proper selection of parameters.