Surface doping of GaxIn1−xAs semiconductor crystals with magnesium
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Surface doping of GaxIn1−xAs semiconductor crystals with magnesium. / Yasir, M.; Mäkelä, J.; Koiva, D.; Tuominen, M.; Dahl, J.; Lehtiö, J.-P.; Kuzmin, M.; Rad, Z. Jahanshah; Punkkinen, M.; Laukkanen, P.; Kokko, K.; Polojärvi, V.; Lyytikäinen, J.; Tukiainen, A.; Guina, M.
julkaisussa: Materialia, Vuosikerta 2, 10.2018, s. 33-36.Tutkimustuotos › › vertaisarvioitu
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TY - JOUR
T1 - Surface doping of GaxIn1−xAs semiconductor crystals with magnesium
AU - Yasir, M.
AU - Mäkelä, J.
AU - Koiva, D.
AU - Tuominen, M.
AU - Dahl, J.
AU - Lehtiö, J.-P.
AU - Kuzmin, M.
AU - Rad, Z. Jahanshah
AU - Punkkinen, M.
AU - Laukkanen, P.
AU - Kokko, K.
AU - Polojärvi, V.
AU - Lyytikäinen, J.
AU - Tukiainen, A.
AU - Guina, M.
N1 - EXT="Mäkelä, J." EXT="Tuominen, M." EXT="Kuzmin, M." EXT="Laukkanen, P." EXT="Kokko, K."
PY - 2018/10
Y1 - 2018/10
N2 - Effects of magnesium (Mg) alloying of GaxIn1−xAs(100) semiconductor surfaces have been investigated by low-energy electron diffraction, scanning tunneling microscopy/spectroscopy, and responsivity analysis of an infrared-detector component. In particular, the formation of an unusual Mg-induced (2 × 1) structure on GaAs(100) surfaces is found when depositing 1–3 monolayers of Mg on a cleaned GaAs(100) surface followed by annealing the sample in vacuum conditions at up to 500 °C. Concomitantly, the spectroscopy data show that the Fermi-level shifts toward valence band at the surface, indicating p-type doping of a surface part of GaAs due to Mg incorporation into the semiconductor. This surface-doping effect is also present in a test GaxIn1−xAs infrared detector, leading to increase in the detector responsivity. This beneficial effect of Mg-induced p-type doping is explained by a band-bending induced transfer of electrons away from a defect-rich top interface.
AB - Effects of magnesium (Mg) alloying of GaxIn1−xAs(100) semiconductor surfaces have been investigated by low-energy electron diffraction, scanning tunneling microscopy/spectroscopy, and responsivity analysis of an infrared-detector component. In particular, the formation of an unusual Mg-induced (2 × 1) structure on GaAs(100) surfaces is found when depositing 1–3 monolayers of Mg on a cleaned GaAs(100) surface followed by annealing the sample in vacuum conditions at up to 500 °C. Concomitantly, the spectroscopy data show that the Fermi-level shifts toward valence band at the surface, indicating p-type doping of a surface part of GaAs due to Mg incorporation into the semiconductor. This surface-doping effect is also present in a test GaxIn1−xAs infrared detector, leading to increase in the detector responsivity. This beneficial effect of Mg-induced p-type doping is explained by a band-bending induced transfer of electrons away from a defect-rich top interface.
KW - GaAs, Mg-induced reconstruction, Surface doping, STM, Infrared detector
U2 - 10.1016/j.mtla.2018.05.008
DO - 10.1016/j.mtla.2018.05.008
M3 - Article
VL - 2
SP - 33
EP - 36
JO - Materialia
JF - Materialia
SN - 2589-1529
ER -