Surface relief and refractive index gratings patterned in chalcogenide glasses and studied by off-axis digital holography

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Surface relief and refractive index gratings patterned in chalcogenide glasses and studied by off-axis digital holography. / Cazac, V.; Meshalkin, A.; Achimova, E.; Abashkin, V.; Katkovnik, V.; Shevkunov, I.; Claus, D.; Pedrini, G.

julkaisussa: Applied Optics, Vuosikerta 57, Nro 3, 20.01.2018, s. 507-513.

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Cazac, V. ; Meshalkin, A. ; Achimova, E. ; Abashkin, V. ; Katkovnik, V. ; Shevkunov, I. ; Claus, D. ; Pedrini, G. / Surface relief and refractive index gratings patterned in chalcogenide glasses and studied by off-axis digital holography. Julkaisussa: Applied Optics. 2018 ; Vuosikerta 57, Nro 3. Sivut 507-513.

Bibtex - Lataa

@article{54ad7f4174594bf7a5fd56e8fc66ae9f,

title = "Surface relief and refractive index gratings patterned in chalcogenide glasses and studied by off-axis digital holography",

abstract = "Surface relief gratings and refractive index gratings are formed by direct holographic recording in amorphous chalcogenide nanomultilayer structures As2S3−Se and thin films As2S3. The evolution of the grating parameters, such as the modulation of refractive index and relief depth in dependence of the holographic exposure, is investigated. Off-axis digital holographic microscopy is applied for the measurement of the photoinduced phase gratings. For the high-accuracy reconstruction of the wavefront (amplitude and phase) transmitted by the fabricated gratings, we used a computational technique based on the sparse modeling of phase and amplitude. Both topography and refractive index maps of recorded gratings are revealed. Their separated contribution in diffraction efficiency is estimated.",

author = "V. Cazac and A. Meshalkin and E. Achimova and V. Abashkin and V. Katkovnik and I. Shevkunov and D. Claus and G. Pedrini",

year = "2018",

month = "1",

day = "20",

doi = "10.1364/AO.57.000507",

language = "English",

volume = "57",

pages = "507--513",

journal = "Applied Optics",

issn = "1559-128X",

publisher = "Optical Society of America",

number = "3",

}

RIS (suitable for import to EndNote) - Lataa

TY - JOUR

T1 - Surface relief and refractive index gratings patterned in chalcogenide glasses and studied by off-axis digital holography

AU - Cazac, V.

AU - Meshalkin, A.

AU - Achimova, E.

AU - Abashkin, V.

AU - Katkovnik, V.

AU - Shevkunov, I.

AU - Claus, D.

AU - Pedrini, G.

PY - 2018/1/20

Y1 - 2018/1/20

N2 - Surface relief gratings and refractive index gratings are formed by direct holographic recording in amorphous chalcogenide nanomultilayer structures As2S3−Se and thin films As2S3. The evolution of the grating parameters, such as the modulation of refractive index and relief depth in dependence of the holographic exposure, is investigated. Off-axis digital holographic microscopy is applied for the measurement of the photoinduced phase gratings. For the high-accuracy reconstruction of the wavefront (amplitude and phase) transmitted by the fabricated gratings, we used a computational technique based on the sparse modeling of phase and amplitude. Both topography and refractive index maps of recorded gratings are revealed. Their separated contribution in diffraction efficiency is estimated.

AB - Surface relief gratings and refractive index gratings are formed by direct holographic recording in amorphous chalcogenide nanomultilayer structures As2S3−Se and thin films As2S3. The evolution of the grating parameters, such as the modulation of refractive index and relief depth in dependence of the holographic exposure, is investigated. Off-axis digital holographic microscopy is applied for the measurement of the photoinduced phase gratings. For the high-accuracy reconstruction of the wavefront (amplitude and phase) transmitted by the fabricated gratings, we used a computational technique based on the sparse modeling of phase and amplitude. Both topography and refractive index maps of recorded gratings are revealed. Their separated contribution in diffraction efficiency is estimated.

U2 - 10.1364/AO.57.000507

DO - 10.1364/AO.57.000507

M3 - Article

VL - 57

SP - 507

EP - 513

JO - Applied Optics

JF - Applied Optics

SN - 1559-128X

IS - 3

ER -

TUTCRIS