TUTCRIS - Tampereen teknillinen yliopisto

TUTCRIS

Texture detection in noisy images by combining several local parameters

Tutkimustuotosvertaisarvioitu

Yksityiskohdat

AlkuperäiskieliEnglanti
Otsikko2015 2nd International Scientific-Practical Conference Problems of Infocommunications Science and Technology, PIC S and T 2015 - Conference Proceedings
KustantajaInstitute of Electrical and Electronics Engineers Inc.
Sivut230-233
Sivumäärä4
ISBN (elektroninen)9789669751928
DOI - pysyväislinkit
TilaJulkaistu - 14 joulukuuta 2015
OKM-julkaisutyyppiA4 Artikkeli konferenssijulkaisussa
Tapahtuma2nd International Scientific-Practical Conference Problems of Infocommunications Science and Technology, PIC S and T 2015 - Kharkiv, Ukraina
Kesto: 13 lokakuuta 201515 lokakuuta 2015

Conference

Conference2nd International Scientific-Practical Conference Problems of Infocommunications Science and Technology, PIC S and T 2015
MaaUkraina
KaupunkiKharkiv
Ajanjakso13/10/1515/10/15

Tiivistelmä

A problem of detecting textural areas in images corrupted by noise is considered. Detection is based on joint use of several local parameters calculated in scanning windows (blocks) of different size. Trained support vector machine (SVM) classifier is used for combining local parameters. Factors that influence detector performance are analyzed. It is shown that detector performance can be improved by taking into account information from classifier output for neighbor pixels.