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Transmission electron energy-loss spectroscopy measurements of the dialectric function of Si/Sio2 multilayers

Tutkimustuotosvertaisarvioitu

Standard

Transmission electron energy-loss spectroscopy measurements of the dialectric function of Si/Sio2 multilayers. / Keränen, J.; Lepistö, T.; Ryen, L.; Novikov, S.V.; Olsson, E.

julkaisussa: Journal of Applied Physics, Vuosikerta 84, Nro 12, 1998, s. 6827-6831.

Tutkimustuotosvertaisarvioitu

Harvard

Keränen, J, Lepistö, T, Ryen, L, Novikov, SV & Olsson, E 1998, 'Transmission electron energy-loss spectroscopy measurements of the dialectric function of Si/Sio2 multilayers', Journal of Applied Physics, Vuosikerta. 84, Nro 12, Sivut 6827-6831.

APA

Keränen, J., Lepistö, T., Ryen, L., Novikov, S. V., & Olsson, E. (1998). Transmission electron energy-loss spectroscopy measurements of the dialectric function of Si/Sio2 multilayers. Journal of Applied Physics, 84(12), 6827-6831.

Vancouver

Keränen J, Lepistö T, Ryen L, Novikov SV, Olsson E. Transmission electron energy-loss spectroscopy measurements of the dialectric function of Si/Sio2 multilayers. Journal of Applied Physics. 1998;84(12):6827-6831.

Author

Keränen, J. ; Lepistö, T. ; Ryen, L. ; Novikov, S.V. ; Olsson, E. / Transmission electron energy-loss spectroscopy measurements of the dialectric function of Si/Sio2 multilayers. Julkaisussa: Journal of Applied Physics. 1998 ; Vuosikerta 84, Nro 12. Sivut 6827-6831.

Bibtex - Lataa

@article{bc7db3ea483f4a3a96b68cc7e21f861e,
title = "Transmission electron energy-loss spectroscopy measurements of the dialectric function of Si/Sio2 multilayers",
author = "J. Ker{\"a}nen and T. Lepist{\"o} and L. Ryen and S.V. Novikov and E. Olsson",
note = "Contribution: organisation=mol elm,FACT1=1",
year = "1998",
language = "English",
volume = "84",
pages = "6827--6831",
journal = "Journal of Applied Physics",
issn = "0021-8979",
publisher = "AMER INST PHYSICS",
number = "12",

}

RIS (suitable for import to EndNote) - Lataa

TY - JOUR

T1 - Transmission electron energy-loss spectroscopy measurements of the dialectric function of Si/Sio2 multilayers

AU - Keränen, J.

AU - Lepistö, T.

AU - Ryen, L.

AU - Novikov, S.V.

AU - Olsson, E.

N1 - Contribution: organisation=mol elm,FACT1=1

PY - 1998

Y1 - 1998

M3 - Article

VL - 84

SP - 6827

EP - 6831

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

IS - 12

ER -